By enabling on-machine roughness metrology the NanoCam Sq increases throughput and reduces the risk of damage to expensive, mission-critical optics.
The NanoCam Sq profilometer utilizes Dynamic Interferometry®, incorporating a high-speed optical sensor that measures thousands of times faster than typical profilers. Because acquisition time is so short, the NanoCam Sq can measure despite vibration, making it possible to mount the instrument in polishing equipment, on gantries or on robots. This freedom of positioning means that the instrument can measure any location on the surface of a large optic, and that the optic can be located anywhere, including on polishing equipment.
Applications for the NanoCam Sq optical profiler include surface roughness of small and large coated/uncoated optics, on-machine surface roughness metrology, and process control for polishing operations.
The NanoCam Sq Dynamic Profiler is a complete system including the profiler, computer system and 4Sight™ advanced analysis software. Industry-leading 4Sight reports ISO 25178 surface roughness parameters and provides extensive 2D and 3D analysis options, data filtering, masking, database and import/export functions.
NanoCam Sq Data Sheet.pdf